Portable parallel test generation for sequential circuits

IEEE/ACM International Conference on Computer-Aided Design

Volumn , Issue , 1992, Pages 220-223

  Ramkumar, Balkrishna ^a   Banerjee, Prithviraj ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SOFTWARE; COMPUTER SOFTWARE PORTABILITY; DATA PROCESSING; ELECTRIC FAULT LOCATION; MATHEMATICAL MODELS; PARALLEL PROCESSING SYSTEMS; PROGRAM PROCESSORS; TESTING;

ISCAS 89 BENCHMARK PROGRAMS; PARALLEL TEST GENERATION ALGORITHM PROPERTEST; PODEM ALGORITHM; PORTABLE PARALLEL TEST GENERATION;

SEQUENTIAL CIRCUITS;

EID: 0027005302     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.1992.279371     Document Type: Conference Paper

References (6)