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Volumn 46, Issue , 1992, Pages 186-192
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What is capability? or what is Cp and Cpk?
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Author keywords
[No Author keywords available]
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Indexed keywords
MEASUREMENTS;
PROCESS ENGINEERING;
QUALITY CONTROL;
STATISTICAL METHODS;
TOLERANCES;
CONTROL CHARTS;
PRODUCT CAPABILITY;
PRODUCT SPECIFICATIONS;
STATISTICAL PROCESS CONTROL;
PROCESS CONTROL;
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EID: 0027003017
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (7)
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References (0)
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