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Volumn , Issue , 1992, Pages 505-508
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Investigation of single event effects of high energetic heavy ions
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ION BEAMS;
MICROELECTRONICS;
RANDOM ACCESS STORAGE;
HEAVY IONS;
SINGLE EVENT EFFECTS;
RADIATION EFFECTS;
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EID: 0027002388
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (2)
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