Freeze!: a new approach for testing sequential circuits

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 22-25

  Abramovici, Miron ^a   Rajan, Krishna B ^a   Miller, David T ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMIC LANGUAGES; ALGORITHMS; COMBINATORIAL MATHEMATICS; FLIP FLOP CIRCUITS; LOGIC CIRCUITS; PARALLEL PROCESSING SYSTEMS;

SEQUENTIAL TEST GENERATION;

SEQUENTIAL CIRCUITS;

EID: 0026992971     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)