Apt: an area-performance-testability driven placement algorithm

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 141-146

  Kim, Sungho ^a   Banerjee, Prithviraj ^a   Chickermane, Vivek ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIGITAL ARITHMETIC; FLIP CHIP DEVICES; LOGIC CIRCUITS;

AREA PERFORMANCE TESTABILITY; SCAN FLIP-FLOPS;

INTEGRATED CIRCUIT TESTING;

EID: 0026991468     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)