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Volumn 114, Issue 4, 1992, Pages 378-383

Comparison of modeling techniques for the vibration analysis of printed circuit cards

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DYNAMIC RESPONSE; ELECTRONICS PACKAGING; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; MECHANICAL TESTING; PERFORMANCE; RELIABILITY; SMART CARDS; SURFACE MOUNT TECHNOLOGY; VIBRATION CONTROL;

EID: 0026989242     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2905468     Document Type: Article
Times cited : (54)

References (20)
  • 1
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    • PWB Solder Joint Fatigue Life Calculations Under Thermal and Vibrational Loading
    • State University of New York at Binghamton, Binghamton, New York, March
    • Barker, D., 1991, “PWB Solder Joint Fatigue Life Calculations Under Thermal and Vibrational Loading,” Presented at the Mechanical and Industrial Engineering Department Seminar Series, State University of New York at Binghamton, Binghamton, New York, March 1.
    • (1991) Presented at the Mechanical and Industrial Engineering Department Seminar Series , pp. 1
    • Barker, D.1
  • 3
    • 0003909950 scopus 로고
    • Swanson Analysis Systems, Incorporated, Houston, PA
    • DeSalvo, G. L, and Gorman, R. W., 1989, ANSYS Users Manual, Swanson Analysis Systems, Incorporated, Houston, PA.
    • (1989) ANSYS Users Manual
    • Desalvo, G.L.1    Gorman, R.W.2
  • 4
    • 0022802218 scopus 로고
    • Finding the Stresses with Finite Elements
    • Oct
    • Engel, P. A., and Lim, C. K., 1986, “Finding the Stresses with Finite Elements,” Mechanical Engineering, Vol. 108, No. 10, Oct., pp. 46-50.
    • (1986) Mechanical Engineering , vol.108 , Issue.10 , pp. 46-50
    • Engel, P.A.1    Lim, C.K.2
  • 6
    • 85024545859 scopus 로고
    • Structural Analysis for Circuit Card Systems Subject to Bending
    • Mar
    • Engel, P. A., 1990, “Structural Analysis for Circuit Card Systems Subject to Bending,” ASME Journal of Electronic Packaging, Vol. 112, Mar., pp. 210.
    • (1990) ASME Journal of Electronic Packaging , vol.112 , pp. 210
    • Engel, P.A.1
  • 7
    • 0003828237 scopus 로고
    • Research Studies Press, Ltd. and Wiley, New York, N.Y
    • Ewins, D., 1984, Modal Testing: Theory and Practice, Research Studies Press, Ltd. and Wiley, New York, N.Y.
    • (1984) Modal Testing: Theory and Practice
    • Ewins, D.1
  • 9
    • 0025508247 scopus 로고
    • Extensions of the Modal Assurance Criterion
    • Oct
    • Heylen, W., and Janter, T., 1990, “Extensions of the Modal Assurance Criterion,” ASME Journal of Vibration and Acoustics, Vol. 112, Oct., pp. 468-472.
    • (1990) ASME Journal of Vibration and Acoustics , vol.112 , pp. 468-472
    • Heylen, W.1    Janter, T.2
  • 11
    • 0003895417 scopus 로고
    • Gordon and Breach Publishing Company, New York, N.Y
    • Lekhnitskii, G. S., 1968, Anisotropic Plates, Gordon and Breach Publishing Company, New York, N.Y.
    • (1968) Anisotropic Plates
    • Lekhnitskii, G.S.1
  • 12
    • 0026220770 scopus 로고
    • The ‘Smeared Property Technique for the FE Vibration Analysis of Printed Circuit Cards,”
    • Sept
    • Pitarresi, J. M., Caletka, D. V., Caldwell, R., and Smith, D. E., 1991, “The ‘Smeared’ Property Technique for the FE Vibration Analysis of Printed Circuit Cards,” ASME Journal of Electronic Packaging, Vol. 113, Sept., pp. 250-257.
    • (1991) ASME Journal of Electronic Packaging , vol.113 , pp. 250-257
    • Pitarresi, J.M.1    Caletka, D.V.2    Caldwell, R.3    Smith, D.E.4
  • 13
    • 85024521857 scopus 로고
    • Reliability Assessment of Multi-chip Modules via Time Domain Simulation
    • Project Presentation
    • Pitarresi, J. M., 1991, “Reliability Assessment of Multi-chip Modules via Time Domain Simulation,” Project Presentation, IBM/GE UIC Consortium.
    • (1991) IBM/GE UIC Consortium
    • Pitarresi, J.M.1
  • 15
    • 0022241013 scopus 로고
    • Mechanical Design of Circuit Boards Using Finite Element Analysis
    • Pittsburgh, Pa., Apr. 1720
    • Renner, T. E., 1985, “Mechanical Design of Circuit Boards Using Finite Element Analysis,” ANSYS Conference Proceedings, Pittsburgh, Pa., Apr. 1720, pp. 1.2-1.22.
    • (1985) ANSYS Conference Proceedings , pp. 2
    • Renner, T.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.