Hot-Electron-Induced Degradation of Front and Back Channels in Partially and Fully Depleted SIMOX MOSFET's

IEEE Electron Device Letters

Volumn 13, Issue 12, 1992, Pages 603-605

  Cristoloveanu, S ^a   Gulwadi, S M ^b   Ioannou, D E ^b   Campisi, G J ^c   Hughes, H L ^c  

^a CNRS   (France)

^b GEORGE MASON UNIVERSITY   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; HOT CARRIERS;

FRONT/BACK CHANNELS; FULLY DEPLETED MOSFETS; HOT-ELECTRON-INDUCED DEGRADATION; PARTIALLY DEPLETED MOSFETS; SIMOX MOSFETS;

MOSFET DEVICES;

EID: 0026987239     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.192858     Document Type: Article

References (9)

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