Delay fault models and test generation for random logic sequential circuits

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 165-172

  Chakraborty, Tapan J ^a   Agrawal, Vishwani D ^a   Bushnell, Michael L ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL MATHEMATICS; FLIP FLOP CIRCUITS; SENSITIVITY ANALYSIS; SET THEORY;

FAULT MODELS; TEST GENERATION;

SEQUENTIAL CIRCUITS;

EID: 0026986184     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)