Closed-loop extraction of the spatial distribution of interface traps based on numerical model of the charge-pumping experiment

Conference on Solid State Devices and Materials

Volumn , Issue , 1992, Pages 170-172

  Habas, Predrag ^a   Selberiierr, Siegfried ^a  

^a INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; MATHEMATICAL MODELS; SEMICONDUCTOR INSULATOR BOUNDARIES;

CHARGE PUMPING; INTERFACE TRAPS;

SEMICONDUCTOR DEVICES;

EID: 0026985192     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)