Equivalence of robust delay-fault and single stuck-fault test generation

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 173-176

  Saldanha, Alexander ^a   Brayton, Robert K ^a   Sangiovanni Vincentelli, Alberto L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; EQUIVALENCE CLASSES; LOGIC GATES; SET THEORY;

ROBUST DELAY FAULTS; SINGLE STUCK FAULT TEST GENERATION;

INTEGRATED CIRCUITS;

EID: 0026984772     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)