Test-set preserving logic transformations

Proceedings - Design Automation Conference

Volumn , Issue , 1992, Pages 454-458

  Batek, Michael J ^a   Hayes, John P ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DESIGN; MANY VALUED LOGICS; OPTIMIZATION; SET THEORY;

CARRY LOOK AHEAD; RIPPLE CARRY DESIGN;

COMBINATORIAL CIRCUITS;

EID: 0026980596     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)