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Volumn 46, Issue , 1992, Pages 538-544
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Implementing six sigma for interconnect technology
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATION;
INSPECTION;
INTEGRATED CIRCUIT MANUFACTURE;
OPTICAL DEVICES;
PROCESS CONTROL;
STATISTICAL METHODS;
SURFACE MOUNT TECHNOLOGY;
AUTOMATED VISUAL INSPECTION;
DESIGN OF EXPERIMENTS;
INTERCONNECT TECHNOLOGY;
SIX SIGMA QUALITY;
STATISTICAL PROCESS CONTROL;
QUALITY CONTROL;
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EID: 0026966796
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (26)
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References (16)
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