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Volumn 1681, Issue , 1992, Pages 190-195
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Optically based methods for process analysis
a
a
USA
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICAL VARIABLES MEASUREMENT;
PROCESS CONTROL;
QUALITY CONTROL;
PROCESS ANALYSIS;
PROCESS VARIABLES;
COLORIMETERS;
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EID: 0026961553
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (3)
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