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Volumn 39, Issue 11, 1992, Pages 879-892

Transient Simulation of Lossy Interconnects Based on the Recursive Convolution Formulation

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; COUPLED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC LOSSES; ELECTRIC WIRING; ERROR ANALYSIS; NONLINEAR NETWORKS; SKIN EFFECT; TRANSIENTS;

EID: 0026944320     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.199887     Document Type: Article
Times cited : (210)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.