Mosfet Effective Channel Length, Threshold Voltage, And Series Resistance Determination By Robust Optimization

IEEE Transactions on Electron Devices

Volumn 39, Issue 10, 1992, Pages 2298-2311

  Mcandrew, Colin C ^a   Layman, Paul A ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; OPTIMIZATION; SPURIOUS SIGNAL NOISE;

EFECTIVE CHANNEL LENGTH; MOSFET PARAMETERS; NONLINEAR OPTIMIZATION; ROBUST OPTIMIZATION; THRESHOLD VOLTAGE;

MOSFET DEVICES;

EID: 0026940475     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.158802     Document Type: Article

References (12)

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