Afm imaging, roughness analysis and contact mechanics of magnetic tape and head surfaces

Journal of Tribology

Volumn 114, Issue 4, 1992, Pages 666-674

  Oden, P I ^a   Majumdar, A ^a   Bhushan, B ^b,c   Padmanabhan, A ^a   Graham, J J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRACTALS; IMAGING TECHNIQUES; INTERFACES (MATERIALS); MAGNETIC HEADS; MAGNETIC TAPE; MICROSCOPIC EXAMINATION; ROUGHNESS MEASUREMENT; SURFACE PROPERTIES; TRIBOLOGY;

ATOMIC FORCE MICROSCOPE (AFM) IMAGING; CONTACT MECHANICS; FRACTAL ANALYSIS; NON CONTACT OPTICAL PROFILER (NOP);

MAGNETIC TAPE STORAGE;

EID: 0026938647     PISSN: 07424787     EISSN: 15288897     Source Type: Journal    
DOI: 10.1115/1.2920934     Document Type: Article

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