Atomic force microscope studies of CuCl island formation on CaF2(111) substrates

Surface Science

Volumn 277, Issue 3, 1992, Pages

  Tong, William M ^a   Snyder, Eric J ^a   Williams, R Stanley ^a   Yanase, Akihisa ^b   Segawa, Yusaburo ^b   Anderson, Mark S ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; DIFFUSION; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; SUBSTRATES; SURFACE PHENOMENA; THIN FILMS;

ATOMIC FORCE MICROSCOPY; CUPROUS CHLORIDE; ISLANDING;

SEMICONDUCTOR MATERIALS;

EID: 0026932287     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(92)90757-W     Document Type: Article

References (12)

1. Growth and luminescence spectroscopy of a CuCl quantum well structure
2. Analysis of Scanning Tunneling Microscope Topographs of Graphite Surfaces Roughened by Ar+ Ion Bombardment
3. Crossover effects in models of kinetic growth with surface diffusion