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Volumn 46, Issue 1-4, 1992, Pages 375-393
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Quantitative scanning tunneling microscopy and scanning force microscopy of organic materials
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ORGANIC MATTER;
CONFERENCE PAPER;
SCANNING ELECTRON MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
BIOLOGICAL MATERIALS;
CHARACTERIZATION;
ELECTRON TUNNELING;
ELECTRONIC PROPERTIES;
METALLIC FILMS;
MOLECULES;
OPTICAL RESOLVING POWER;
PROTEINS;
SIGNAL TO NOISE RATIO;
SUBSTRATES;
THIN FILMS;
MOLECULAR MONOLAYERS;
SCANNING FORCE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
MICROSCOPIC EXAMINATION;
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EID: 0026931778
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-3991(92)90025-F Document Type: Article |
Times cited : (82)
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References (86)
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