메뉴 건너뛰기




Volumn 41, Issue 5, 1992, Pages 646-652

A Nonlinear Least-Squares Solution with Causality Constraints Applied to Transmission Line Permittivity and Permeability Determination

Author keywords

Dielectric measurements; higher order modes; microwave; orthogonal distance regression; permeability; permittivity; primary mode

Indexed keywords

DATA PROCESSING; ELECTROMAGNETIC WAVE SCATTERING; LEAST SQUARES APPROXIMATIONS; MAGNETIC PERMEABILITY; PERMITTIVITY MEASUREMENT; REGRESSION ANALYSIS; TRANSMISSION LINE THEORY;

EID: 0026930227     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.177336     Document Type: Article
Times cited : (87)

References (10)
  • 1
    • 0018007454 scopus 로고
    • A combined total reflection transmission method in application to dielectric spectroscopy
    • Sept
    • S. Stuchly and M. Matuszewski, “A combined total reflection transmission method in application to dielectric spectroscopy,” IEEE Trans. Instrum. Meas., vol. IM-27, pp. 285–288, Sept. 1978.
    • (1978) IEEE Trans. Instrum. Meas. , vol.IM-27 , pp. 285-288
    • Stuchly, S.1    Matuszewski, M.2
  • 2
    • 0001345219 scopus 로고
    • A new method for measuring dielectric constant and loss in the range of centimeter waves
    • July
    • S. Roberts and A. von Hippel, “A new method for measuring dielectric constant and loss in the range of centimeter waves,” J. Appl. Phys., vol. 7, pp. 610–616, July 1946.
    • (1946) J. Appl. Phys. , vol.7 , pp. 610-616
    • Roberts, S.1    Hippel, A.V.2
  • 3
    • 0025474631 scopus 로고
    • Improved technique for determining complex permittivity with the transmission/reflection method
    • Aug
    • J. Baker-Jarvis, E. Vanzura, and W. Kissick, “Improved technique for determining complex permittivity with the transmission/reflection method,” IEEE Trans. Microwave Theory and Techniques, vol. 38, pp. 1096–1103, Aug. 1990.
    • (1990) IEEE Trans. Microwave Theory and Techniques , vol.38 , pp. 1096-1103
    • Baker-Jarvis, J.1    Vanzura, E.2    Kissick, W.3
  • 4
    • 0000543165 scopus 로고
    • Measurement of rf properties of a materials survey
    • June
    • H. E. Bussey, “Measurement of rf properties of a materials survey,” Proc. IEEE, vol. 55, pp. 1046–1053, June 1967.
    • (1967) Proc. IEEE , vol.55 , pp. 1046-1053
    • Bussey, H.E.1
  • 5
    • 0008872989 scopus 로고
    • Microwave measurement of the dielectric constant using a sliding short-circuited waveguide method
    • Oct
    • G. Maze, J. L. Bonnefoy, and M. Kamarei, “Microwave measurement of the dielectric constant using a sliding short-circuited waveguide method,” Microwave Journal, pp. 77–88, Oct. 1990.
    • (1990) Microwave Journal , pp. 77-88
    • Maze, G.1    Bonnefoy, J.L.2    Kamarei, M.3
  • 6
    • 0026224588 scopus 로고
    • Optimization techniques for permittivity and permeability determination
    • P. D. Domich, J. Baker-Jarvis, and R. Geyer, “Optimization techniques for permittivity and permeability determination,” Tech. Rep., NIST, 1991.
    • (1991) Tech. Rep., NIST
    • Domich, P.D.1    Baker-Jarvis, J.2    Geyer, R.3
  • 7
    • 0141841503 scopus 로고
    • Transmission/reflection and short-circuit line permittivity measurements
    • National Institute of Standards and Technology
    • J. Baker-Jarvis, “Transmission/reflection and short-circuit line permittivity measurements,” NIST Tech. Note 1341, National Institute of Standards and Technology, 1990.
    • (1990) NIST Tech. Note 1341
    • Baker-Jarvis, J.1
  • 10
    • 0015980602 scopus 로고
    • Automatic measurement of complex dielectric constant and permeability at microwave frequencies
    • Jan
    • W. B. Weir, “Automatic measurement of complex dielectric constant and permeability at microwave frequencies,” Proc. IEEE, vol. 62, pp. 33–36, Jan. 1974.
    • (1974) Proc. IEEE , vol.62 , pp. 33-36
    • Weir, W.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.