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Volumn 31, Issue 9 R, 1992, Pages 2954-2958

Patterning Characteristics of a Chemically-Amplified Negative Resist in Synchrotron Radiation Lithography

Author keywords

Chemically amplified resist; Critical dimension control; Exposure latitude; Post exposure baking; Resolution; Sr lithography; X ray lithography

Indexed keywords

AMPLIFICATION; DIMENSIONAL STABILITY; FABRICATION; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; PATTERN RECOGNITION; SYNCHROTRON RADIATION; X RAY LITHOGRAPHY;

EID: 0026928382     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.31.2954     Document Type: Article
Times cited : (90)

References (16)
  • 12
    • 84957139731 scopus 로고
    • (Mechanical Engineering Hand book) (Japan Society of Mechanical Engineers, Japan) 6th ed
    • C. Watamori 1977 Kikaikougakubinran (Mechanical Engineering Hand book) (Japan Society of Mechanical Engineers, Japan) 6th ed., p. 4-51 [in Japanese].
    • (1977) Kikaikougakubinran , pp. 4-51
    • Watamori, C.1
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.