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Volumn 27, Issue 9, 1992, Pages 1245-1254

Physical Timing Modeling for Bipolar VLSI

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPUTER SIMULATION; DIGITAL CIRCUITS; MATHEMATICAL MODELS; OPTIMIZATION;

EID: 0026923446     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.149428     Document Type: Article
Times cited : (11)

References (12)
  • 1
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    • Advances in bipolar VLSI
    • Nov.
    • G. Wilson, “Advances in bipolar VLSI.” Proc. IEEE, vol. 78, no. 11, Nov. 1990.
    • (1990) Proc. IEEE , vol.78 , Issue.11
    • Wilson, G.1
  • 2
    • 0018505201 scopus 로고
    • Bipolar transistor design for optimized power-delay logic circuits
    • Aug.
    • D. D. Tang and P. M. Solomon, “Bipolar transistor design for optimized power-delay logic circuits,” IEEE J. Solid-State Circuits, vol. SC-14, pp. 679–684, Aug. 1979.
    • (1979) IEEE J. Solid-State Circuits , vol.SC-14 , pp. 679-684
    • Tang, D.D.1    Solomon, P.M.2
  • 3
    • 0001451810 scopus 로고
    • A propagation-delay expression and its application to the optimization of polysilicon emitter ECL process
    • Feb.
    • E.-F. Chor, A. Brunnschweiler, and P. Ashbum, “A propagation-delay expression and its application to the optimization of polysilicon emitter ECL process,” IEEE J. Solid-State Circuits, vol. 23, pp. 251-259, Feb. 1988.
    • (1988) IEEE J. Solid-State Circuits , vol.23 , pp. 251-259
    • Chor, E.-F.1    Brunnschweiler, A.2    Ashbum, P.3
  • 4
    • 0025419648 scopus 로고
    • Accurate analytical delay expressions for ECL and CML circuits and their applications to optimizing high-speed bipolar circuits
    • Apr.
    • W. Fang, “Accurate analytical delay expressions for ECL and CML circuits and their applications to optimizing high-speed bipolar circuits,” IEEE J. Solid-State Circuits, vol. 25, p. 572, Apr. 1990.
    • (1990) IEEE J. Solid-State Circuits , vol.25 , pp. 572
    • Fang, W.1
  • 5
    • 0024611584 scopus 로고
    • Influence of device parameters on the switching speed of BiCMOS buffers
    • Feb.
    • G. P. Rosseel and R. W. Dutton, “Influence of device parameters on the switching speed of BiCMOS buffers,” IEEE J. Solid-State Circuits, vol. 24, pp. 90–99, Feb. 1989.
    • (1989) IEEE J. Solid-State Circuits , vol.24 , pp. 90-99
    • Rosseel, G.P.1    Dutton, R.W.2
  • 6
    • 0025948684 scopus 로고
    • Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical de-lay-time modeling
    • Jan.
    • M. Fujishima, K. Asada, and T. Sugano, “Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical de-lay-time modeling,” IEEE J. Solid-State Circuits, vol. 26, pp. 25–31, Jan. 1991.
    • (1991) IEEE J. Solid-State Circuits , vol.26 , pp. 25-31
    • Fujishima, M.1    Asada, K.2    Sugano, T.3
  • 7
    • 0026154198 scopus 로고
    • An accurate analytical delay model for BiCMOS driver circuits
    • May
    • C. H. Diaz, S. M. Kang, and Y. Leblebici, “An accurate analytical delay model for BiCMOS driver circuits,” IEEE Trans. Computer-Aided Design, vol. 10, no. 5, pp. 577–588, May 1991.
    • (1991) IEEE Trans. Computer-Aided Design , vol.10 , Issue.5 , pp. 577-588
    • Diaz, C.H.1    Kang, S.M.2    Leblebici, Y.3
  • 8
    • 0025208814 scopus 로고
    • An analytical model for the determination of the transient response of CML and ECL gates
    • Jan.
    • M. Y. Ghannam, R. P. Mertens, and R. J. V. Overstraeten, “An analytical model for the determination of the transient response of CML and ECL gates,” IEEE Trans. Electron Devices, vol. 37, no. 1, pp. 191–201, Jan. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , Issue.1 , pp. 191-201
    • Ghannam, M.Y.1    Mertens, R.P.2    Overstraeten, R.J.V.3
  • 10
    • 0027089473 scopus 로고
    • Bipolar timing modeling including interconnects based on parametric correction
    • Nov.
    • A. T. Yang and Y. H. Chang, “Bipolar timing modeling including interconnects based on parametric correction,” in Proc. IEEE Int. Conf. Computer-Aided Design, Nov. 1991, pp. 354–357.
    • (1991) Proc. IEEE Int. Conf. Computer-Aided Design , pp. 354-357
    • Yang, A.T.1    Chang, Y.H.2
  • 11
    • 84937350085 scopus 로고
    • Large-signal behavior of junction transistors
    • J. J. Ebers and J. L. Moll, “Large-signal behavior of junction transistors,” Proc. IRE, vol. 42, 1954.
    • (1954) Proc. IRE , vol.42
    • Ebers, J.J.1    Moll, J.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.