Reproducible fabrication technique of nanometric tip diameter fiber probe for photon Scanning Tunneling Microscope

Japanese Journal of Applied Physics

Volumn 31, Issue 9, 1992, Pages L1302-L1304

  Pangaribuan, Togar ^a   Yamada, Kazunobu ^a   Jiang, Shudong ^a   Ohtsu, Motoichi ^a   Ohsawa, Hisao ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NIKON CORPORATION   (Japan)

Author keywords

Chemical etching; Optical fiber; Photon; Scanning tunneling microscope

Indexed keywords

ELECTRON MICROSCOPES; ETCHING; FABRICATION; PHOTONS; PROBES; DOPING (ADDITIVES); GERMANIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY;

CHEMICAL ETCHING; NANOMETRIC TIP DIAMETER FIBER PROBES; PHOTON SCANNING TUNNELING MICROSCOPE (PSTM); FIBER PROBES; PHOTON SCANNING TUNNELING MICROSCOPES; SELECTIVE CHEMICAL ETCHING;

OPTICAL FIBERS;

EID: 0026918550     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.31.L1302     Document Type: Article

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