Local Magnetoresistive Response in Thin-Film Ni-Fe Read Elements: A Sub-Micrometer-Resolution Measurement System

IEEE Transactions on Magnetics

Volumn 28, Issue 5, 1992, Pages 3060-3065

  Brug, James A ^b   Kos, Anthony B ^a   Thompson, C A ^a   Petersen, Timothy W ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEMAGNETIZATION; ELECTRIC RESISTANCE MEASUREMENT; IRON; MAGNETIC DOMAINS; MAGNETIC FIELD MEASUREMENT; MAGNETIC HEADS; MAGNETIC VARIABLES MEASUREMENT; MAGNETISM; NICKEL;

BARKHAUSEN NOISE; FOUR-PROBE RESISTANCE MEASUREMENT; MAGNETIC READ HEADS; MAGNETORESISTIVE RESPONSE; THIN-FILM READ ELEMENTS;

MAGNETIC THIN FILMS;

EID: 0026911662     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.179716     Document Type: Article

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