메뉴 건너뛰기




Volumn 32, Issue 2, 1992, Pages 107-133

Epitaxial CoSi2 and NiSi2 thin films

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; EPITAXIAL GROWTH; FABRICATION; INTERFACES (MATERIALS); NICKEL COMPOUNDS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR METAL BOUNDARIES; THIN FILMS;

EID: 0026908987     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/0254-0584(92)90268-D     Document Type: Review
Times cited : (109)

References (207)
  • 60
    • 84915356132 scopus 로고
    • Growth of Thin Nickel Silicide Layers on Clean B-Doped Si(111) Surfaces at Room Temperature
    • (1990) MRS Proceedings , vol.160 , pp. 263
    • Luo1    Smith2    Gibson3
  • 63
    • 84911229243 scopus 로고
    • Growth of Epitaxial CoSi2 and NiSi2 on (111), (100), and (110) Si at Room Temperature
    • (1990) MRS Proceedings , vol.160 , pp. 243
    • Tung1    Schrey2
  • 80
    • 84915411904 scopus 로고
    • Evolution of Stress During Heteroepitaxial Growth of NiSi2 on (001) and (111) Silicon Substrates
    • (1990) MRS Proceedings , vol.160 , pp. 249
    • Ho1    Bauer2    Mahajan3
  • 85
    • 84915383091 scopus 로고    scopus 로고
    • J. E. Rowe, R. S. Becker, G. K. Wertheim and R. T. Tung, to be published.
  • 88
    • 0020088049 scopus 로고
    • Lattice Imaging of Silicide–Silicon Interfaces and the Interpretation of Interfacial Defects
    • (1982) physica status solidi (a) , vol.69 , pp. 779
    • Föil1
  • 115
    • 84915383089 scopus 로고    scopus 로고
    • D. J. Eaglesham, R. T. Tung and J. P. Sullivan, to be published.
  • 116
    • 2342565566 scopus 로고
    • Surface structure and the origin of interfacial dislocations in epitaxial films
    • (1985) Surface Science , vol.152-153 , pp. 1197
    • Pond1    Cherns2
  • 122
    • 84915383088 scopus 로고    scopus 로고
    • R. S. Becker, R. T. Tung, J. P. Sullivan, to be published.
  • 127
    • 84915363003 scopus 로고
    • Schottky Barrier Heights at Singe Crystal Metal Semiconductor Interfaces
    • (1985) MRS Proceedings , vol.37 , pp. 345
    • Tung1
  • 198
    • 84915383086 scopus 로고    scopus 로고
    • D. J. Eaglesham, R. T. Tung and S. M. Yalisove, to be published.
  • 207
    • 84915383085 scopus 로고    scopus 로고
    • S. Mantl and H. L. Bay, to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.