Design and Performance of a Non-Contacting Probe for Measurements on High-Frequency Planar Circuits

IEEE Transactions on Microwave Theory and Techniques

Volumn 40, Issue 8, 1992, Pages 1701-1708

  Osofsky, Samuel S ^a   Schwarz, S E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROBES--APPLICATIONS; PROBES--DESIGN; PROBES--PERFORMANCE;

ERROR REDUCTION TECHNIQUE; HIGH-FREQUENCY PLANAR CIRCUITS; NON-CONTACTING PROBE; OPTIMAL DESIGN; S-PARAMETER MEASUREMENTS;

INTEGRATED CIRCUITS;

EID: 0026901310     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.149550     Document Type: Article

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