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Ultramicroscopy

Volumn 42-44, Issue PART 1, 1992, Pages 7-15

Force microscopy

(1) Binnig, G a

a IBM RESEARCH (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATIONS; FORCE MEASUREMENT;

FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

MICROSCOPIC EXAMINATION;

DNA;

CONFERENCE PAPER; MICROSCOPY; SCANNING FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

EID: 0026898391 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/0304-3991(92)90240-K Document Type: Article

Times cited : (99)

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