메뉴 건너뛰기




Volumn 27, Issue 7, 1992, Pages 1002-1013

Optimization of Buffer Stages in Bipolar VLSI Systems

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS, BUFFER; INTEGRATED CIRCUITS, CMOS; LOGIC CIRCUITS, EMITTER COUPLED; SEMICONDUCTOR DEVICES, BIPOLAR;

EID: 0026898340     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.142595     Document Type: Article
Times cited : (10)

References (16)
  • 1
    • 0024611584 scopus 로고
    • Influence of device parameters on the switching speed of BiCMOS buffers
    • Feb.
    • G. P. Rosseel and R. W. Dutton, “Influence of device parameters on the switching speed of BiCMOS buffers,” IEEE J. Solid-Stale Circuits, vol. 24, pp. 90–99, Feb. 1989.
    • (1989) IEEE J. Solid-Stale Circuits , vol.24 , pp. 90-99
    • Rosseel, G.P.1    Dutton, R.W.2
  • 2
    • 0026154198 scopus 로고
    • An accurate analytical delay model for BiCMOS driver circuits
    • May
    • C. H. Diaz, S. M. Kang, and Y. Leblebici, “An accurate analytical delay model for BiCMOS driver circuits,” IEEE Trans. Computer-Aided Design, vol. 10, pp. 577–588, May 1991.
    • (1991) IEEE Trans. Computer-Aided Design , vol.10 , pp. 577-588
    • Diaz, C.H.1    Kang, S.M.2    Leblebici, Y.3
  • 3
    • 0025948684 scopus 로고
    • Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical delay modeling
    • Jan.
    • M. Fujishima, K. Ashada, and T. Sugano, “Evaluation of delay-time degradation of low-voltage BiCMOS based on a novel analytical delay modeling,” IEEE J. Solid-State Circuits, vol. 26, pp. 25–31, Jan. 1991.
    • (1991) IEEE J. Solid-State Circuits , vol.26 , pp. 25-31
    • Fujishima, M.1    Ashada, K.2    Sugano, T.3
  • 4
    • 0018505201 scopus 로고
    • Bipolar transistor design for optimized power-delay logic circuits
    • Aug.
    • D. D. Tank and P. M. Solomon, “Bipolar transistor design for optimized power-delay logic circuits,” IEEE J. Solid-State Circuits, vol. SC-14, pp. 679–684, Aug. 1979.
    • (1979) IEEE J. Solid-State Circuits , vol.SC-14 , pp. 679-684
    • Tank, D.D.1    Solomon, P.M.2
  • 5
    • 0001451810 scopus 로고
    • A propagation delay expression and its application to the optimization by polysilicon emitter ECL processes
    • Feb.
    • E.-F. Chor, A. Brunnschweiler, and P. Ashburn, “A propagation delay expression and its application to the optimization by polysilicon emitter ECL processes,” IEEE J. Solid-State Circuits, vol. 23, pp. 251–259, Feb. 1988.
    • (1988) IEEE J. Solid-State Circuits , vol.23 , pp. 251-259
    • Chor, E.F.1    Brunnschweiler, A.2    Ashburn, P.3
  • 6
    • 0025419648 scopus 로고
    • Accurate analytical delay expressions for ECL and CML circuits and their applications to optimizing highspeed bipolar circuits
    • Apr.
    • W. Fang, “Accurate analytical delay expressions for ECL and CML circuits and their applications to optimizing highspeed bipolar circuits,” IEEE J. Solid-State Circuits, vol. 25, pp. 572–583, Apr. 1990.
    • (1990) IEEE J. Solid-State Circuits , vol.25 , pp. 572-583
    • Fang, W.1
  • 7
    • 0022809986 scopus 로고
    • Optimization and scaling of CMOS-bipolar drivers for VLSI interconnects
    • Nov.
    • H. J. De Los Santos and B. Hoefflinger, “Optimization and scaling of CMOS-bipolar drivers for VLSI interconnects,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1722–1730, Nov. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 1722-1730
    • De Los Santos, H.J.1    Hoefflinger, B.2
  • 9
    • 0025208814 scopus 로고
    • An analytical model for the determination of the transient response of CML and ECL gates
    • Jan.
    • M. Y. Ghannam, R. P. Mertens, and R. J. Van Overstraeten, “An analytical model for the determination of the transient response of CML and ECL gates,” IEEE Trans. Electron Devices, vol. 37, pp. 191–201, Jan. 1991.
    • (1991) IEEE Trans. Electron Devices , vol.37 , pp. 191-201
    • Ghannam, M.Y.1    Mertens, R.P.2    Van Overstraeten, R.J.3
  • 11
    • 84941437055 scopus 로고    scopus 로고
    • Dept. EE&CS, Univ. of California, Berkeley.
    • Circuit Simulation Program SPICE3, Dept. EE&CS, Univ. of California, Berkeley.
    • Circuit Simulation Program SPICE3
  • 13
    • 0024682914 scopus 로고
    • A 10K-gate 950-MHz CML demonstrator circuit made with a 1- μnm trench-isolated bipolar silicon technology
    • June
    • M. Depey et al., “A 10K-gate 950-MHz CML demonstrator circuit made with a 1- μnm trench-isolated bipolar silicon technology,” IEEE J. Solid-State Circuits, vol. 24, pp. 552–557, June 1989.
    • (1989) IEEE J. Solid-State Circuits , vol.24 , pp. 552-557
    • Depey, M.1
  • 14
    • 84937658108 scopus 로고
    • A theory of transistor cutoff frequency (fT) falloff at high current densities
    • Mar.
    • C. T. Kirk, “A theory of transistor cutoff frequency (fT) falloff at high current densities,” IRE Trans. Electron Devices, vol. ED-9, pp. 164–174, Mar. 1962.
    • (1962) IRE Trans. Electron Devices , vol.ED-9 , pp. 164-174
    • Kirk, C.T.1
  • 15
    • 0024717210 scopus 로고
    • An improved high-performance logic gate using series diode and resistor loads for ECL/CML applications
    • Aug.
    • B.-Y. Hwang and T. P. Bushey, “An improved high-performance logic gate using series diode and resistor loads for ECL/CML applications,” IEEE J. Solid-State Circuits, vol. 24, pp. 1048–1054, Aug. 1989.
    • (1989) IEEE J. Solid-State Circuits , vol.24 , pp. 1048-1054
    • Hwang, B.Y.1    Bushey, T.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.