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Volumn 34, Issue 1, 1992, Pages 21-30
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Industrial CMOS technology for the integration of optical metrology systems (photo-ASICs)
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUITS, CMOS - INDUSTRIAL APPLICATIONS;
OPTICAL INSTRUMENTS;
OPTICAL METROLOGY SYSTEMS;
PHOTO-ASICS;
SEMICONDUCTOR DIODES, PHOTODIODE;
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EID: 0026898298
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/0924-4247(92)80135-P Document Type: Article |
Times cited : (35)
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References (32)
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