Comparison of background removal methods for XPS

Surface and Interface Analysis

Volumn 18, Issue 7, 1992, Pages 567-570

  Repoux, M ^a  

^a PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTRUM ANALYSIS; X RAY SPECTROSCOPY;

BACKGROUND REMOVAL METHODS; RELATIVE SENSITIVITY FACTOR;

PHOTOELECTRON SPECTROSCOPY;

EID: 0026897395     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.740180719     Document Type: Article

References (13)

1. High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold
2. Relative intensities in photoelectron spectroscopy of atoms and molecules