Experimental Determination of ESD Latent Phenomena in CMOS Integrated Circuits

IEEE Transactions on Industry Applications

Volumn 28, Issue 4, 1992, Pages 755-760

  Greason, William D ^a   Kucerovsky, Zdenek ^a   Chum, Kenneth W ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; FAILURE; INTEGRATED CIRCUITS, CMOS;

CHARGE INJECTION MODELS; CMOS INTEGRATED CIRCUITS; ELECTROSTATIC DISCHARGES; ESD LATENT PHENOMENA; STATISTICAL ANALYSIS;

ELECTROSTATICS;

EID: 0026891541     PISSN: 00939994     EISSN: 19399367     Source Type: Journal    
DOI: 10.1109/28.148439     Document Type: Article

References (15)

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