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Volumn 143, Issue C, 1992, Pages 121-132
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Characterization of gels prepared from silicon ethoxide in presence of HCl and HF
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROSCOPIC EXAMINATION - SCANNING ELECTRON MICROSCOPY;
SILICON COMPOUNDS;
THERMOANALYSIS;
X-RAY ANALYSIS;
AEROGELS;
PORE SIZE DISTRIBUTION;
SILICON ETHOXIDE;
X-RAY DIFFRACTION;
XEROGELS;
GELS;
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EID: 0026881177
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(05)80559-9 Document Type: Article |
Times cited : (8)
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References (22)
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