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Volumn 143, Issue C, 1992, Pages 121-132

Characterization of gels prepared from silicon ethoxide in presence of HCl and HF

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION - SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; THERMOANALYSIS; X-RAY ANALYSIS;

EID: 0026881177     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(05)80559-9     Document Type: Article
Times cited : (8)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.