A Novel Numerical Technique for Dielectric Measurement of Generally Lossy Dielectrics

IEEE Transactions on Instrumentation and Measurement

Volumn 41, Issue 3, 1992, Pages 361-365

  Ganchev, Stoyan I ^a   Bakhtiari, Sasan ^a   Zoughi, Reza ^a  

^a Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; WAVEGUIDES, RECTANGULAR;

ADMITTANCE MEASUREMENT; LOSSY DIELECTRICS; OPEN-ENDED RECTANGULAR WAVEGUIDE; WAVEGUIDE ADMITTANCE;

MICROWAVE MEASUREMENTS;

EID: 0026872437     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.153329     Document Type: Article

References (20)

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