Modeling of Output Snapback Characteristics in n-Channel SOI MOSFET’s

IEEE Transactions on Electron Devices

Volumn 39, Issue 5, 1992, Pages 1170-1178

  Huang, J S T ^a   Chen, H J ^a   Kueng, Jeffrey S ^a  

^a HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, CMOS - DESIGN; TRANSISTORS - MODELING;

MOSFET; SILICON ON INSULATOR DEVICES; SNAPBACK PHENOMENON;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0026869950     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.129099     Document Type: Article

References (10)

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