IC Defect Sensitivity for Footprint-Type Spot Defects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 11, Issue 5, 1992, Pages 638-658

  de Gyvez, Jose Pineda ^a   Di, Chennian ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER METATHEORY - MANY VALUED LOGICS;

DEFECT SEMANTICS; FOOTPRINT-TYPE SPOT DEFECTS; IC DEFECT SENSITIVITY; IC MULTILAYERS; SUSCEPTIBLE SITES;

INTEGRATED CIRCUITS;

EID: 0026869428     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.127625     Document Type: Article

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