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Volumn 31, Issue 5 R, 1992, Pages 1258-1266
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Hole Compensation Mechanism of P-Type GaN Films
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Author keywords
Atomic hydrogen; Hall measurement; Hydrogenation; P type GaN; Photoluminescence; Thermal annealing
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Indexed keywords
ELECTRON BEAMS;
HYDROGEN;
PHOTOLUMINESCENCE;
SEMICONDUCTING FILMS - ELECTRONIC PROPERTIES;
GALLIUM NITRIDE;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0026867861
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.31.1258 Document Type: Article |
Times cited : (950)
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References (29)
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