Self-heating in BJT circuit parameter extraction

Solid State Electronics

Volumn 35, Issue 5, 1992, Pages 677-679

  Reisch, Michael ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS;

BJT CIRCUITS; SEMICONDUCTOR WAFERS; WAFERS;

TRANSISTORS, BIPOLAR;

EID: 0026867578     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(92)90036-C     Document Type: Article

References (7)

1. Method for determining the emitter and base series resistances of bipolar transistors