Negative Base Current and Impact Ionization Phenomena in AlGaAs/GaAs HBT's

IEEE Electron Device Letters

Volumn 13, Issue 5, 1992, Pages 253-255

  Zanoni, Enrico ^a   Malik, Roger ^b   Pavan, Paolo ^a   Nagle, Julien ^b   Paccagnella, Alessandro ^a   Canali, Claudio ^c  

^a UNIVERSITY OF PADOVA   (Italy)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; IONIZATION; MATHEMATICAL STATISTICS - MONTE CARLO METHODS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE - CHARGE CARRIERS;

IMPACT IONIZATION; NEGATIVE BASE CURRENT;

TRANSISTORS, BIPOLAR;

EID: 0026867535     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.145044     Document Type: Article

References (13)

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