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Volumn 40, Issue 5, 1992, Pages 1012-1014
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Bias-Dependence of the Intrinsic Element Values of InGaAs/InAlAs/InP Inverted Heterojunction Bipolar Transistor
b,d b a
d
Epi Corporation
*
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROWAVE MEASUREMENTS;
TRANSISTORS, BIPOLAR - MODELING;
MICROWAVE TRANSISTORS;
S PARAMETER MEASUREMENT;
SMALL SIGNAL MODELS;
TRANSISTORS, BIPOLAR;
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EID: 0026866643
PISSN: 00189480
EISSN: 15579670
Source Type: Journal
DOI: 10.1109/22.137411 Document Type: Article |
Times cited : (7)
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References (5)
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