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Volumn 8, Issue 5, 1992, Pages 193-269

Growth and characterization of epitaxial Ni and Co silicides

Author keywords

[No Author keywords available]

Indexed keywords

FILMS--VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY--APPLICATIONS; SEMICONDUCTING INTERMETALLICS--FILMS; SEMICONDUCTOR DEVICES--INTERFACES; SUPERLATTICES--SEMICONDUCTOR;

EID: 0026866232     PISSN: 09202307     EISSN: None     Source Type: Journal    
DOI: 10.1016/0920-2307(92)90003-J     Document Type: Review
Times cited : (229)

References (249)
  • 34
    • 84910821459 scopus 로고
    • Ion-Beam Induced Silicide Formation: Markers and Moving Species
    • (1986) MRS Proceedings , vol.54 , pp. 197
    • Hung1    Mayer2
  • 71
    • 84910877125 scopus 로고
    • Orientations of Ultrathin NiSi2 Layers on Si
    • (1987) MRS Proceedings , vol.77 , pp. 259
    • Tung1
  • 96
    • 84910842940 scopus 로고
    • The Role of Misfit Dislocation During Epitaxial Growth
    • (1987) MRS Proceedings , vol.94 , pp. 99
    • Cherns1
  • 113
    • 84910819729 scopus 로고
    • In-Situ Studies of the MBE Growth of CoSi2 on Si (111) in a UHV Transmission Electron Microscope
    • (1987) MRS Proceedings , vol.94 , pp. 151
    • Gibson1    Batstone2    Tung3
  • 136
    • 84910876415 scopus 로고
    • The Effect of Surface Structure on the Epitaxial Growth of Si on CoSi2(111)
    • (1987) MRS Proceedings , vol.94 , pp. 65
    • Tung1    Hellman2
  • 191
    • 84910857674 scopus 로고
    • Investigation of Interface States on Mbe CoSi2/Si Schottky Contacts by Forward Bias Capacitance Measurement
    • 2nd Ed.
    • (1987) MRS Proceedings , vol.91 , pp. 439
    • Chen1    Kao2    Mii3    Wang4
  • 195
    • 84910858910 scopus 로고
    • Electrical Transport in thin Silicide Films
    • 2nd Ed.
    • (1986) MRS Proceedings , vol.54 , pp. 499
    • Hensel1
  • 213
    • 84910827245 scopus 로고    scopus 로고
    • A. Briggs, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.