Analysis of Current-Voltage Characteristics of Low-Temperature-Processed Polysilicon Thin-Film Transistors

IEEE Transactions on Electron Devices

Volumn 39, Issue 4, 1992, Pages 792-802

  Ono, Kikuo ^a   Aoyama, Takashi ^a   Konishi, Nobutake ^a   Miyata, Kenji ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LOW TEMPERATURE ENGINEERING; SEMICONDUCTING SILICON--CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING SILICON--THIN FILMS;

CURRENT-VOLTAGE CHARACTERISTICS; POLYSILICON;

TRANSISTORS;

EID: 0026854110     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.127467     Document Type: Article

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