Limitations, Innovations, and Challenges of Circuits and Devices into a Half Micrometer and Beyond

IEEE Journal of Solid-State Circuits

Volumn 27, Issue 4, 1992, Pages 465-472

  Nagata, Minoru ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS--PERFORMANCE; NOISE, SPURIOUS SIGNAL--SIGNAL TO NOISE RATIO; SEMICONDUCTING SILICON--APPLICATIONS; SEMICONDUCTOR DEVICES, MOS--APPLICATIONS; SEMICONDUCTOR DEVICES, MOSFET--APPLICATIONS;

BICMOS CIRCUITS; HALF-MICROMETER DEVICES; LOW-VOLTAGE OPERATION;

INTEGRATED CIRCUITS;

EID: 0026852420     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.126533     Document Type: Article

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