Static Analysis of V Transmission Lines

IEEE Transactions on Microwave Theory and Techniques

Volumn 40, Issue 4, 1992, Pages 659-664

  Schutt Aine, Jose E ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--IMPEDANCE;

CHARACTERISTIC IMPEDANCE; EFFECTIVE PERMITTIVITY; METHOD OF MOMENTS; SINGLE-LINE ANALYSIS; STATIC ANALYSIS; V-SHAPED TRANSMISSION LINES;

ELECTRIC NETWORKS;

EID: 0026852335     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.127513     Document Type: Article

References (20)

1. K. E. Bean and P. S. Glenn, “The influence of crystal orientation on silicon semiconductor processing,” Proc. IEEE, vol. 57, pp. 1469–1476, Sept. 1969.
2. K. E. Bean, “Anisotropic etching of silicon,” IEEE Trans. Electron Devices, vol. ED-25, no. 10, pp. 1185–1193, Oct. 1978.
3. I. Adesida and T. E. Everhart, “Substrate thickness considerations in electron beam lithography,” J. Appl. Phys., vol. 51, no. 11, Nov. 1980.
4. E. Bassous, “Fabrication of novel three-dimensional microstructures by the anisotropic etching of (100) and (110) silicon,” IEEE Trans. Electron Devices, vol. ED-25, no. 10, pp. 1178–1185, Oct. 1978.
5. E. Bassous and A. C. Lamberti, “High-selective KOH-based etchant for boron-doped silicon structures,” Microelectronics Engineering, pp. 167–170, 1989.
6. H. A. Wheeler, “Transmission line properties of parallel wide strips by a conformal mapping approximation,” IEEE Trans. Microwave Theory Tech., vol. MTT-12, pp. 280–288, May 1964.
7. H. A. Wheeler, “Transmission line properties of parallel strips separated by a dielectric sheet,” IEEE Trans. Microwave Theory Tech., vol. MTT-13, pp. 172–185, Mar. 1965.
8. P. Silvester, “TEM wave properties of microstrip transmission lines,” Proc. IEEE, vol. 115, 43–48, Jan. 1968.
9. T. G. Bryant and J. A. Weiss, “Parameters of microstrip lines and of coupled pairs of microstrip lines,” IEEE Trans. Microwave Theory Tech., vol. MTT-10, pp. 1021–1027, Dec. 1968.
10. A. Farrar and A. T. Adams, “A potential theory method for covered microstrip,” IEEE Trans. Microwave Theory Tech., vol. MTT-21, pp. 494–496, July 1973.
11. A. Farrar and A. T. Adams, “Characteristic impedance of microstrip by the method of moments,” IEEE Trans. Microwave Theory Tech., vol. MTT-18, 65–66, Jan. 1970.
12. E. Yamashita and R. Mittra, “Variational method for the analysis of microstrip lines,” IEEE Trans. Microwave Theory Tech., vol. MTT-16, 251–256, Apr. 1968.
13. E. Yamashita, “Variational method for the analysis of microstrip-like transmission lines,” IEEE Trans. Microwave Theory Tech., vol. MTT-16, pp. 529–539, Aug. 1968.
14. E. O. Hammerstad, “Equations for microstrip circuit design,” in Proc. European Microwave Conf., Hamburg, Germany, Sept. 1975, pp. 268–272.
15. C. Chan and R. Mittra, “Spectral iterative technique for analyzing multiconductor microstrip lines,” in 1984 IEEE MTT-S Int. Microwave Symp. Dig., San Francisco, CA, pp. 463–465.
16. H. Haus and J. R. Melcher, Electromagnetic Fields and Energy. Englewood Cliffs, NJ: Prentice-Hall, 1989, pp. 243–244.
17. R. E. Harrington, Field Computation by Moment Methods. New York: Macmillan, 1968.
18. “Measuring dielectric constant with the HP 8510 network analyzer,” Hewlett-Packard Application Note 8510–3, Aug. 1985.
19. H. B. Bakoglu, Circuits, Interconnections, and Packaging for VLSI. Reading, MA: Addison-Wesley, 1990, pp. 293–294.
20. J. E. Schutt-Aine and R. Mittra, “Transient analysis of coupled lossy transmission lines with nonlinear terminations,” IEEE Trans. Circuits Syst., vol. CAS-36, pp. 959–967, July 1989.