SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 18, Issue 4, 1992, Pages 251-256

Quantitative surface analysis of layered materials

(2) Holloway, Paul H a Bussing, Tom D a

a UNIVERSITY OF FLORIDA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS - SCATTERING; MATHEMATICAL TRANSFORMATIONS - LAPLACE TRANSFORMS; SOLIDS - SURFACES; SPECTROSCOPY, AUGER ELECTRON - APPLICATIONS;

CONCENTRATION VARIATION; ELECTRON ESCAPE DEPTH; LAYERED MATERIALS; QUANTITATIVE ANALYSIS; VARIATION WITH DEPTH;

SURFACES;

EID: 0026850472 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740180402 Document Type: Article

Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.