Dynamic gate coupling of NMOS for efficient output ESD protection

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1992, Pages 141-150

  Duvvury, Charvaka ^a   Diaz, Carlos ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; GATES (TRANSISTOR); STRESSES;

GATE COUPLING; NMOS DEVICES;

MOS DEVICES;

EID: 0026838967     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1992.363289     Document Type: Conference Paper

References (23)