Reliability growth for typed defects

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1992, Pages 327-336

  Ray, Bonnie K ^a   Bhandari, Inderpal ^a   Chillarege, Ram ^a  

^a Postgraduate Sch Monterey CA USA ^*

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FAILURE ANALYSIS; MATHEMATICAL MODELS; RELIABILITY;

DEFECT CATEGORIZATION; OPERATING SYSTEMS; PROCESS FEEDBACK; RELIABILITY GROWTH; TYPED DEFECTS;

COMPUTER SOFTWARE;

EID: 0026836491     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)