An in-process monitor for n-channel MOSFET hot carrier lifetimes

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1992, Pages 116-121

  Mistry, Kaizad R ^a   Krakauer, David B ^a   Doyle, Brian S ^a   Spooner, Terry A ^a   Jackson, Daniel B ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

HOT CARRIERS; MONITORING; RELIABILITY;

1/F NOISE SIGNALS; ELECTRON INJECTION; HOT CARRIER LIFETIMES;

MOSFET DEVICES;

EID: 0026834364     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1992.187634     Document Type: Conference Paper

References (18)