메뉴 건너뛰기




Volumn 28, Issue 7, 1992, Pages 617-618

Simple binary random number generator

Author keywords

Integrated circuits; Latches

Indexed keywords

ELECTRONIC CIRCUITS, SWITCHING; INTEGRATED CIRCUITS, CMOS;

EID: 0026832107     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19920389     Document Type: Article
Times cited : (21)

References (5)
  • 1
    • 0024751836 scopus 로고
    • Parallel random number generation for VLSI systems using cellular automata
    • HORTENSIUS, P. D., MCLEOD, R. D., and CARD, H. C.: ‘Parallel random number generation for VLSI systems using cellular automata’, IEEE Trans., 1989, C-38, (10), pp. 1466-1472
    • (1989) IEEE Trans. , vol.C-38 , Issue.10 , pp. 1466-1472
    • HORTENSIUS, P.D.1    MCLEOD, R.D.2    CARD, H.C.3
  • 2
    • 0024714960 scopus 로고
    • Cellular automata-based pseudorandom number generators for built-in self-test
    • HORTENSIUS, P. D., MCLEOD, R. D., PRIES, W., MILLER, M., and CARD, H. C.: ‘Cellular automata-based pseudorandom number generators for built-in self-test’, IEEE Trans., 1989, CAD-8, (8), pp. 842-849
    • (1989) IEEE Trans. , vol.CAD-8 , Issue.8 , pp. 842-849
    • HORTENSIUS, P.D.1    MCLEOD, R.D.2    PRIES, W.3    MILLER, M.4    CARD, H.C.5
  • 3
    • 0026185729 scopus 로고
    • Pseudorandom number generators for VLSI systems based on linear cellular automata
    • SALIDES, P., YORK, T. A., and THANAILAKIS, A.: ‘Pseudorandom number generators for VLSI systems based on linear cellular automata’, IEE Proc. E, 1991,138, (4), pp. 241-249
    • (1991) IEE Proc. E , vol.138 , Issue.4 , pp. 241-249
    • SALIDES, P.1    YORK, T.A.2    THANAILAKIS, A.3
  • 4
    • 0026242525 scopus 로고
    • Switched-capacitor broadband noise generator for CMOS VLSI
    • RODRIGUEZ-VAQUEZ, A., DELGADO, M., ESPEJO, S., and HUERTAS, J. L.: ‘Switched-capacitor broadband noise generator for CMOS VLSI’, Electron. Lett., 1991, 27, (21), pp. 1913-1915
    • (1991) Electron. Lett. , vol.27 , Issue.21 , pp. 1913-1915
    • RODRIGUEZ-VAQUEZ, A.1    DELGADO, M.2    ESPEJO, S.3    HUERTAS, J.L.4
  • 5
    • 0020167526 scopus 로고
    • Flip-flop resolving time test circuit
    • ROSEMBERG, F., and CHANEY, T. J.: ‘Flip-flop resolving time test circuit’, IEEE J. Solid-State Circuits, 1982, SC-17, (4), p. 731-738
    • (1982) IEEE J. Solid-State Circuits , vol.SC-17 , Issue.4 , pp. 731-738
    • ROSEMBERG, F.1    CHANEY, T.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.