On the Relationship Between Topography and Transistor Matching in an Analog CMOS Technology

IEEE Transactions on Electron Devices

Volumn 39, Issue 2, 1992, Pages 275-282

  Gregor, Richard W ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDES; SEMICONDUCTOR DEVICES, MOS; TRANSISTORS;

CAPACITOR TOPOGRAPHY; DRAIN CURRENT MISMATCH; GATE OXIDES; NUMERICAL SIMULATIONS; PHOTORESIST; TRANSISTOR MATCHING;

INTEGRATED CIRCUITS, CMOS;

EID: 0026821212     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.121683     Document Type: Article

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