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Volumn 208, Issue 2, 1992, Pages 252-259

Preparation and characterization of tungsten diselenide thin films

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION--SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY, PHOTOELECTRON; SPUTTERING; X-RAY ANALYSIS;

EID: 0026820175     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(92)90652-R     Document Type: Article
Times cited : (48)

References (30)
  • 30
    • 84918249181 scopus 로고
    • The transition metal dichalcogenides discussion and interpretation of the observed optical, electrical and structural properties
    • (1969) Advances in Physics , vol.18 , pp. 193
    • Wilson1    Yoffe2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.