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Volumn 208, Issue 2, 1992, Pages 252-259
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Preparation and characterization of tungsten diselenide thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROSCOPIC EXAMINATION--SCANNING ELECTRON MICROSCOPY;
SPECTROSCOPY, PHOTOELECTRON;
SPUTTERING;
X-RAY ANALYSIS;
TUNGSTEN DISELENIDE;
TUNGSTEN COMPOUNDS;
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EID: 0026820175
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/0040-6090(92)90652-R Document Type: Article |
Times cited : (48)
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References (30)
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