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Volumn 17, Issue 2, 1992, Pages 111-117
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An analysis of defect densities found during software inspections
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SOFTWARE--SOFTWARE ENGINEERING;
SOFTWARE DEVELOPMENT;
COMPUTER SOFTWARE;
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EID: 0026818226
PISSN: 01641212
EISSN: None
Source Type: Journal
DOI: 10.1016/0164-1212(92)90089-3 Document Type: Article |
Times cited : (51)
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References (5)
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